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  Optimal mapping of x-ray laser diffraction patterns into three dimensions using routing algorithms

Kassemeyer, S., Jafarpour, A., Lomb, L., Steinbrener, J. F., Martin, A. V., & Schlichting, I. (2013). Optimal mapping of x-ray laser diffraction patterns into three dimensions using routing algorithms. Physical Review E, E88(4): 042710, pp. 1-9. doi:10.1103/PhysRevE.88.042710.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-914E-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-914F-A
Genre: Journal Article

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PhysRevE StatNonlinSoftMatterPhys_88_2013_042710e.pdf (Any fulltext), 3MB
 
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PhysRevE StatNonlinSoftMatterPhys_88_2013_042710e.pdf
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http://pre.aps.org/pdf/PRE/v88/i4/e042710 (Any fulltext)
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http://dx.doi.org/10.1103/PhysRevE.88.042710 (Any fulltext)
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 Creators:
Kassemeyer, Stefan1, Author           
Jafarpour, Aliakbar1, Author           
Lomb, Lukas1, Author           
Steinbrener, Jan F.1, Author           
Martin, Andrew V., Author
Schlichting, Ilme1, Author           
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1Department of Biomolecular Mechanisms, Max Planck Institute for Medical Research, Max Planck Society, ou_1497700              

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 Abstract: Coherent diffractive imaging with x-ray free-electron lasers (XFEL) promises high-resolution structure determination of noncrystalline objects. Randomly oriented particles are exposed to XFEL pulses for acquisition of two-dimensional (2D) diffraction snapshots. The knowledge of their orientations enables 3D imaging by multiview reconstruction, combining 2D diffraction snapshots in different orientations. Here we introduce a globally optimal algorithm that can infer these orientations. We apply it to experimental XFEL data of nanoparticles and so determine their 3D electron density.

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Language(s): eng - English
 Dates: 2012-11-012013-10-282013-10-282013-10-28
 Publication Status: Issued
 Pages: 9
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1103/PhysRevE.88.042710
Other: 7945
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Title: Physical Review E
  Other : Phys. Rev. E
Source Genre: Journal
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Publ. Info: Melville, NY : American Physical Society
Pages: - Volume / Issue: E88 (4) Sequence Number: 042710 Start / End Page: 1 - 9 Identifier: ISSN: 1539-3755
CoNE: https://pure.mpg.de/cone/journals/resource/954925225012