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  Combined UHV/high-pressure catalysis setup for depth-resolved near-surface spectroscopic characterization and catalytic testing of model catalysts

Mayr, L., Rameshan, R., Klötzer, B., Penner, S., & Rameshan, C. (2014). Combined UHV/high-pressure catalysis setup for depth-resolved near-surface spectroscopic characterization and catalytic testing of model catalysts. Review of Scientific Instruments, 85(5): 055104. doi:10.1063/1.4874002.

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Instrument Paper Revised V2.pdf (Any fulltext), 2MB
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 Creators:
Mayr, Lukas1, Author
Rameshan, Raffael1, 2, Author           
Klötzer, Bernhard1, Author
Penner, Simon1, Author
Rameshan, Christoph1, 3, Author
Affiliations:
1Institute of Physical Chemistry, University of Innsbruck, Innrain 52a, 6020 Innsbruck, Austria, ou_persistent22              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
3Institute of Materials Chemistry, Vienna University of Technology, Getreidemarkt 9/BC/01, 1060 Vienna, Austria , ou_persistent22              

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Free keywords: Catalysis Intermetallic compounds X-ray photoelectron spectroscopy Sample handling Auger electron spectroscopy
 Abstract: An ultra-high vacuum (UHV) setup for “real” and “inverse” model catalyst preparation, depth-resolved near-surface spectroscopic characterization, and quantification of catalytic activity and selectivity under technologically relevant conditions is described. Due to the all-quartz reactor attached directly to the UHV-chamber, transfer of the catalyst for in situ testing without intermediate contact to the ambient is possible. The design of the UHV-compatible re-circulating batch reactor setup allows the study of reaction kinetics under close to technically relevant catalytic conditions up to 1273 K without contact to metallic surfaces except those of the catalyst itself. With the attached differentially pumped exchangeable evaporators and the quartz-microbalance thickness monitoring equipment, a reproducible, versatile, and standardised sample preparation is possible. For three-dimensional near-surface sample characterization, the system is equipped with a hemispherical analyser for X-ray photoelectron spectroscopy (XPS), electron-beam or X-ray-excited Auger-electron spectroscopy, and low-energy ion scattering measurements. Due the dedicated geometry of the X-ray gun (54.7°, “magic angle”) and the rotatable sample holder, depth analysis by angle-resolved XPS measurements can be performed. Thus, by the combination of characterisation methods with different information depths, a detailed three-dimensional picture of the electronic and geometric structure of the model catalyst can be obtained. To demonstrate the capability of the described system, comparative results for depth-resolved sample characterization and catalytic testing in methanol steam reforming on PdGa and PdZn near-surface intermetallic phases are shown.

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Language(s): eng - English
 Dates: 2013-12-102014-04-172014-05-052014-05
 Publication Status: Issued
 Pages: 8
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1063/1.4874002
 Degree: -

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Title: Review of Scientific Instruments
Source Genre: Journal
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Publ. Info: Woodbury, N.Y. [etc.] : American Institute of Physics
Pages: - Volume / Issue: 85 (5) Sequence Number: 055104 Start / End Page: - Identifier: ISSN: 0034-6748
CoNE: https://pure.mpg.de/cone/journals/resource/991042742033452