English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  How to Measure Patent Thickets: A Novel Approach

Von Graevenitz, G., Wagner, S., & Harhoff, D. (2011). How to Measure Patent Thickets: A Novel Approach. Economics Letters, 111(1), 6-9.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-8C63-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-8FC9-5
Genre: Journal Article

Files

show Files

Locators

show
hide
Locator:
http://dx.doi.org/10.1016/j.econlet.2010.12.005 (Publisher version)
Description:
-
OA-Status:

Creators

show
hide
 Creators:
Von Graevenitz, Georg1, Author
Wagner, Stefan1, Author
Harhoff, Dietmar1, Author           
Affiliations:
1External Organizations, ou_persistent22              

Content

show
hide
Free keywords: Patenting; Patent thickets; Patent portfolio races; Complexity
 Abstract: This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.

Details

show
hide
Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Economics Letters
  Abbreviation : Econ. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Amsterdam : North-Holland
Pages: - Volume / Issue: 111 (1) Sequence Number: - Start / End Page: 6 - 9 Identifier: ISSN: 0165-1765
ZDB: 717210-2
CoNE: https://pure.mpg.de/cone/journals/resource/954925481602