High viscosity environments: an unexpected route to obtain true atomic 
resolution with atomic force microscopy

Weber, Stefan A. L.; Kilpatrick, J. I.; Brosnan, T. M.; Jarvis, S. P.; Rodriguez, B. J.

doi:10.1088/0957-4484/25/17/175701

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High viscosity environments: an unexpected route to obtain true atomic resolution with atomic force microscopy

Weber, S. A. L., Kilpatrick, J. I., Brosnan, T. M., Jarvis, S. P., & Rodriguez, B. J. (2014). High viscosity environments: an unexpected route to obtain true atomic resolution with atomic force microscopy. Nanotechnology, 25: 175701. doi:10.1088/0957-4484/25/17/175701.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-8C92-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-8C94-D

Genre: Journal Article

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Creators:
Weber, Stefan A. L.¹, Author
Kilpatrick, J. I., Author
Brosnan, T. M., Author
Jarvis, S. P., Author
Rodriguez, B. J., Author

Affiliations:
1Dept. Butt: Physics at Interfaces, MPI for Polymer Research, Max Planck Society, ou_1800286

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Language(s): eng - English

Dates: Date issued: 2014

Publication Status: Issued

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Identifiers: DOI: 10.1088/0957-4484/25/17/175701

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Title: Nanotechnology

Source Genre: Journal

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Publ. Info: Bristol, UK : IOP Pub.

Pages: 17 Volume / Issue: 25 Sequence Number: 175701 Start / End Page: - Identifier: ISSN: 0957-4484
CoNE: https://pure.mpg.de/cone/journals/resource/954925577042