Techniques to prevent sample surface charging and reduce beam damage effects 
for SBEM imaging

Titze, Benjamin

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Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging

Titze, B. (2013). Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging. PhD Thesis, Ruprecht-Karls-Universität Heidelberg, Heidelberg.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-8E57-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-8E58-9

Genre: Thesis

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Creators:
Titze, Benjamin¹, Author

Affiliations:
1Department of Biomedical Optics, Max Planck Institute for Medical Research, Max Planck Society, ou_1497699

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Language(s): eng - English

Dates: Date issued: 2013-07-24

Publication Status: Issued

Pages: 112

Publishing info: Heidelberg : Ruprecht-Karls-Universität Heidelberg

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Degree: PhD

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