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  Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry

Ghezzi, F., Caniello, R., Giubertoni, D., Bersani, M., Hakola, A., Mayer, M., et al. (2014). Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry. Applied Surface Science, 315, 459-466. doi:10.1016/j.apsusc.2014.06.091.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-28B6-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-28B7-D
Genre: Journal Article

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http://dx.doi.org/10.1016/j.apsusc.2014.06.091 (Publisher version)
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 Creators:
Ghezzi , F.1, Author
Caniello, R.1, Author
Giubertoni, D.1, Author
Bersani, M.1, Author
Hakola, A.1, Author
Mayer, M.2, Author           
Rohde, V.2, Author           
Anderle, M.1, Author
ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society, Author              
Affiliations:
1External Organizations, ou_persistent22              
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              

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Language(s): eng - English
 Dates: 20142014
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/j.apsusc.2014.06.091
 Degree: -

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Title: Applied Surface Science
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Amsterdam : Elsevier B.V.
Pages: - Volume / Issue: 315 Sequence Number: - Start / End Page: 459 - 466 Identifier: ISSN: 0169-4332
CoNE: https://pure.mpg.de/cone/journals/resource/954928576736