Ghezzi, F., Caniello, R., Giubertoni, D., Bersani, M., Hakola, A., Mayer, M., et al. (2014). Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry. Applied Surface Science, 315, 459-466. doi:10.1016/j.apsusc.2014.06.091.