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  In Situ Electron Microscopy and Micro-Laue Study of Plasticity in Miniaturized Cu Bicrystals

Imrich, P. J., Kirchlechner, C., Motz, C., Jeon, J. B., & Dehm, G. (2014). In Situ Electron Microscopy and Micro-Laue Study of Plasticity in Miniaturized Cu Bicrystals. Talk presented at CAMTEC III, Symposium on Fine-Scale Mechanical Characterisation and Behaviour. Cambridge, UK. 2014-04-07 - 2014-04-08.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-001A-187B-C Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-AAF5-3
Genre: Talk

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 Creators:
Imrich, Peter Julian1, Author              
Kirchlechner, Christoph2, Author              
Motz, Christian3, Author              
Jeon, Jong Bae4, Author              
Dehm, Gerhard4, Author              
Affiliations:
1Erich-Schmid-Institute of Materials Science, Austrian Academy of Sciences, Jahnstrasse 12, 8700 Leoben, Austria, ou_persistent22              
2Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
3Department of Materials Science, Saarland University, Saarbrücken, Germany, ou_persistent22              
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2014
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: CAMTEC III, Symposium on Fine-Scale Mechanical Characterisation and Behaviour
Place of Event: Cambridge, UK
Start-/End Date: 2014-04-07 - 2014-04-08
Invited: Yes

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