In Situ Electron Microscopy and Micro-Laue Study of Plasticity in Miniaturized 
Cu Bicrystals

Imrich, Peter Julian; Kirchlechner, Christoph; Motz, Christian; Jeon, Jong Bae; Dehm, Gerhard

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In Situ Electron Microscopy and Micro-Laue Study of Plasticity in Miniaturized Cu Bicrystals

Imrich, P. J., Kirchlechner, C., Motz, C., Jeon, J. B., & Dehm, G. (2014). In Situ Electron Microscopy and Micro-Laue Study of Plasticity in Miniaturized Cu Bicrystals. Talk presented at CAMTEC III, Symposium on Fine-Scale Mechanical Characterisation and Behaviour. Cambridge, UK. 2014-04-07 - 2014-04-08.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-001A-187B-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-AAF5-3

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Creators:
Imrich, Peter Julian¹, Author
Kirchlechner, Christoph², Author
Motz, Christian³, Author
Jeon, Jong Bae⁴, Author
Dehm, Gerhard⁴, Author

Affiliations:
1Erich-Schmid-Institute of Materials Science, Austrian Academy of Sciences, Jahnstrasse 12, 8700 Leoben, Austria, ou_persistent22
2Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
3Department of Materials Science, Saarland University, Saarbrücken, Germany, ou_persistent22
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398

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Language(s): eng - English

Dates: Created: 2014

Publication Status: Not specified

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Title: CAMTEC III, Symposium on Fine-Scale Mechanical Characterisation and Behaviour

Place of Event: Cambridge, UK

Start-/End Date: 2014-04-07 - 2014-04-08

Invited: Yes

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