Scanning tunnelling microscopy on organic field-effect transistors based on 
intrinsic pentacene

Roelofs, W. S. C.; Charrier, D. S. H.; Dzwilewski, A.; Janssen, R. A. J.; de Leeuw, Dago M.; Kemerink, M.

doi:10.1063/1.4886155

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Scanning tunnelling microscopy on organic field-effect transistors based on intrinsic pentacene

Roelofs, W. S. C., Charrier, D. S. H., Dzwilewski, A., Janssen, R. A. J., de Leeuw, D. M., & Kemerink, M. (2014). Scanning tunnelling microscopy on organic field-effect transistors based on intrinsic pentacene. Applied Physics Letters, 104(26): 263301. doi:10.1063/1.4886155.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-C027-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-C02A-D

Genre: Journal Article

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Creators:
Roelofs, W. S. C., Author
Charrier, D. S. H., Author
Dzwilewski, A., Author
Janssen, R. A. J., Author
de Leeuw, Dago M.¹, Author
Kemerink, M., Author

Affiliations:
1Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society, ou_1800284

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Language(s): eng - English

Dates: Date issued: 2014

Publication Status: Issued

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Identifiers: DOI: 10.1063/1.4886155

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Title: Applied Physics Letters

Source Genre: Journal

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Publ. Info: Melville, NY : American Institute of Physics

Pages: - Volume / Issue: 104 (26) Sequence Number: 263301 Start / End Page: - Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223