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  In-plane and out-of-plane defects of graphite bombarded by H, D and He investigated by atomic force and Raman microscopies

Pardanaud, C., Martin, C., Cartry, G., Ahmad, A., Schiesko, L., Giacometti, G., et al. (2015). In-plane and out-of-plane defects of graphite bombarded by H, D and He investigated by atomic force and Raman microscopies. Journal of Raman Spectroscopy, 46(2), 256-265. doi:10.1002/jrs.4624.

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pardanaud_in-plane.pdf (Supplementary material), 2MB
 
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http://dx.doi.org/10.1002/jrs.4624 (Publisher version)
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 Creators:
Pardanaud, C.1, Author
Martin, C.1, Author
Cartry, G.1, Author
Ahmad, A.1, Author
Schiesko, L.2, Author           
Giacometti, G.1, Author
Carrere, M.1, Author
Roubin, P.1, Author
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1External Organizations, ou_persistent22              
2ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856290              

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Language(s): eng - English
 Dates: 20142015
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: DOI: 10.1002/jrs.4624
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Title: Journal of Raman Spectroscopy
Source Genre: Journal
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Publ. Info: Chichester : John Wiley & Sons, Ltd.
Pages: - Volume / Issue: 46 (2) Sequence Number: - Start / End Page: 256 - 265 Identifier: ISSN: 0377-0486
CoNE: https://pure.mpg.de/cone/journals/resource/954925526813