High-quality Scanning Using Time-of-flight Depth Superresolution

Schuon, Sebastian; Theobalt, Christian; Davis, James; Thrun, Sebastian

doi:10.1109/CVPRW.2008.4563171

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High-quality Scanning Using Time-of-flight Depth Superresolution

Schuon, S., Theobalt, C., Davis, J., & Thrun, S. (2008). High-quality Scanning Using Time-of-flight Depth Superresolution. In IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops 2008 (pp. 1-7). Piscataway, NJ: IEEE. doi:10.1109/CVPRW.2008.4563171.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-CDF7-E Version Permalink: https://hdl.handle.net/21.11116/0000-000E-321C-B

Genre: Conference Paper

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Creators:
Schuon, Sebastian¹, Author
Theobalt, Christian¹, Author
Davis, James¹, Author
Thrun, Sebastian¹, Author

Affiliations:
1External Organizations, ou_persistent22

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Language(s): eng - English

Dates: Published Online: 2008Date issued: 2008

Publication Status: Issued

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Rev. Type: -

Identifiers: DOI: 10.1109/CVPRW.2008.4563171
BibTex Citekey: SchTheDavThr08

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Title: Workshop on Time of Flight Based Computer Vision

Place of Event: Anchorage, AK

Start-/End Date: 2008-06-23 - 2008-06-28

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Title: IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops 2008

Other : CVPRW '08

Abbreviation : CVPRW 2008/TOV-CV

Source Genre: Proceedings

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Affiliations:

Publ. Info: Piscataway, NJ : IEEE

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1 - 7 Identifier: ISBN: 978-1-4244-2339-2
ISBN: 978-1-4244-2340-8
ISSN: 2160-7508