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  Characterization of InGaAs‐based cameras for astronomical applications using a new VIS‐NIR‐SWIR detector test bench

Schindler, K., Wolf, J., & Krabbe, A. (2014). Characterization of InGaAs‐based cameras for astronomical applications using a new VIS‐NIR‐SWIR detector test bench. Proceedings of the SPIE, 9145, 91450X‐91450X‐13.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0023-D19C-6 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0023-D19D-4
Genre: Conference Paper

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 Creators:
Schindler, Karsten1, 2, Author              
Wolf, Jürgen, Author
Krabbe, Alfred, Author
Affiliations:
1Department Planets and Comets, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832288              
2IMPRS on Physical Processes in the Solar System and Beyond, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832290              

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 Dates: 2014
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1117/12.2057052
BibTex Citekey: Schindler:2014-070
 Degree: -

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Title: Proceedings of the SPIE
Source Genre: Journal
 Creator(s):
Stepp, Larry M., Editor
Gilmozzi, Roberto, Editor
Hall, Helen J., Editor
Affiliations:
-
Publ. Info: -
Pages: - Volume / Issue: 9145 Sequence Number: - Start / End Page: 91450X‐91450X‐13 Identifier: -