Characterization of InGaAs‐based cameras for astronomical applications using a 
new VIS‐NIR‐SWIR detector test bench

Schindler, Karsten; Wolf, Jürgen; Krabbe, Alfred

doi:10.1117/12.2057052

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Characterization of InGaAs‐based cameras for astronomical applications using a new VIS‐NIR‐SWIR detector test bench

Schindler, K., Wolf, J., & Krabbe, A. (2014). Characterization of InGaAs‐based cameras for astronomical applications using a new VIS‐NIR‐SWIR detector test bench. Proceedings of the SPIE, 9145, 91450X‐91450X‐13.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-D19C-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-D19D-4

Genre: Conference Paper

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Creators:
Schindler, Karsten^{1, 2}, Author
Wolf, Jürgen, Author
Krabbe, Alfred, Author

Affiliations:
1Department Planets and Comets, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832288
2IMPRS on Physical Processes in the Solar System and Beyond, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832290

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Dates: Date issued: 2014

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1117/12.2057052
BibTex Citekey: Schindler:2014-070

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Title: Proceedings of the SPIE

Source Genre: Journal

Creator(s):
Stepp, Larry M., Editor
Gilmozzi, Roberto, Editor
Hall, Helen J., Editor

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-

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Pages: - Volume / Issue: 9145 Sequence Number: - Start / End Page: 91450X‐91450X‐13 Identifier: -