Recombination activity at the atomic scale: Correlative analysis of grain 
boundaries in multicrystalline silicon solar cells

Stoffers, Andreas; Cojocaru-Mirédin, Oana; Breitenstein, Otwin; Seifert, Winfried; Raabe, Dierk

Local TagsRelease HistoryDetailsSummary

Recombination activity at the atomic scale: Correlative analysis of grain boundaries in multicrystalline silicon solar cells

Stoffers, A., Cojocaru-Mirédin, O., Breitenstein, O., Seifert, W., & Raabe, D. (2013). Recombination activity at the atomic scale: Correlative analysis of grain boundaries in multicrystalline silicon solar cells. Talk presented at Euromat 2013. Sevilla, Spain. 2013-09-08 - 2013-09-13.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-DCC5-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-DCCC-8

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Stoffers, Andreas¹, Author
Cojocaru-Mirédin, Oana², Author
Breitenstein, Otwin³, Author
Seifert, Winfried⁴, Author
Raabe, Dierk⁵, Author

Affiliations:
1Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
3Experimental Department II, Max-Planck-Institut für Mikrostrukturphysik, Halle, Germany, ou_persistent22
4Joint Lab IHP/BTU, Cottbus, Germany, ou_persistent22
5Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

Content

show

Details

show

hide

Language(s): eng - English

Dates: Created: 2013

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

hide

Title: Euromat 2013

Place of Event: Sevilla, Spain

Start-/End Date: 2013-09-08 - 2013-09-13

Invited: Yes

Legal Case

show

Project information

show

Source

show