English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography

Stoffers, A., Cojocaru-Mirédin, O., Breitenstein, O., Seifert, W., Zaefferer, S., & Raabe, D. (2014). Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. Talk presented at 40th IEEE Photovoltaic Specialists Conference. Denver, CO, USA. 2014-06-08 - 2014-06-13.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0023-DCC1-D Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0023-DCC2-B
Genre: Talk

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Stoffers, Andreas1, Author              
Cojocaru-Mirédin, Oana1, Author              
Breitenstein, Otwin2, Author              
Seifert, Winfried3, Author              
Zaefferer, Stefan4, Author              
Raabe, Dierk5, Author              
Affiliations:
1Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387              
2Experimental Department II, Max-Planck-Institut für Mikrostrukturphysik, Halle, Germany, ou_persistent22              
3Joint Lab IHP/BTU, Cottbus, Germany, ou_persistent22              
4Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
5Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2014
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: 40th IEEE Photovoltaic Specialists Conference
Place of Event: Denver, CO, USA
Start-/End Date: 2014-06-08 - 2014-06-13

Legal Case

show

Project information

show

Source

show