High Throughput Quantification of Grain Boundary Segregation by Correlative 
Transmission Electron Microscopy and Atom Probe Tomography

Herbig, Michael; Raabe, Dierk; Li, Yujiao; Choi, Pyuck-Pa; Zaefferer, Stefan; Goto, Shoji

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High Throughput Quantification of Grain Boundary Segregation by Correlative Transmission Electron Microscopy and Atom Probe Tomography

Herbig, M., Raabe, D., Li, Y., Choi, P.-P., Zaefferer, S., & Goto, S. (2014). High Throughput Quantification of Grain Boundary Segregation by Correlative Transmission Electron Microscopy and Atom Probe Tomography. Talk presented at International Conference on Atom Probe Tomography & Microscopy 2014. Stuttgart, Germany. 2014-08-31 - 2014-09-05.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-DBF2-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-DBF6-0

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Creators:
Herbig, Michael¹, Author
Raabe, Dierk², Author
Li, Yujiao¹, Author
Choi, Pyuck-Pa¹, Author
Zaefferer, Stefan³, Author
Goto, Shoji², Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
3Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Created: 2014

Publication Status: Not specified

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Title: International Conference on Atom Probe Tomography & Microscopy 2014

Place of Event: Stuttgart, Germany

Start-/End Date: 2014-08-31 - 2014-09-05

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