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  Low-dosage maximum-a-posteriori focusing and stigmation

Binding, J., Mikula, S., & Denk, W. (2013). Low-dosage maximum-a-posteriori focusing and stigmation. Microscopy and Microanalysis, 19(1), 38-55. doi:10.1017/S1431927612013852.

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Genre: Journal Article
Alternative Title : Low-dosage maximum-a-posteriori focusing and stigmation

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MicroscopMicroanalys_19_2013_38.pdf (Any fulltext), 963KB
 
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 Creators:
Binding, Jonas1, Author              
Mikula, Shawn1, Author              
Denk, Winfried1, Author              
Affiliations:
1Department of Biomedical Optics, Max Planck Institute for Medical Research, Max Planck Society, ou_1497699              

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Free keywords: autofocus; wavefront measurement; scanning electron microscopy (SEM); phase diversity
 Abstract: Radiation damage is often an issue during high−resolution imaging, making low−dose focusing and stigmation essential, in particular when no part of the sample can be

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Language(s): eng - English
 Dates: 2012-03-192012-08-042013-02-042013-02-01
 Publication Status: Published in print
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 Table of Contents: -
 Rev. Type: Peer
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Title: Microscopy and Microanalysis
Source Genre: Journal
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Publ. Info: New York, NY : Springer-Verlag New York
Pages: - Volume / Issue: 19 (1) Sequence Number: - Start / End Page: 38 - 55 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414