Wide-angle X-ray scattering studies using an area detector: Crystallite 
orientation in semicrystalline PET structures

Göschel, U.; Deutscher, K.; Abetz, V.

doi:10.1016/0032-3861(96)81592-8

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Wide-angle X-ray scattering studies using an area detector: Crystallite orientation in semicrystalline PET structures

Göschel, U., Deutscher, K., & Abetz, V. (1996). Wide-angle X-ray scattering studies using an area detector: Crystallite orientation in semicrystalline PET structures. Polymer, 37(1), 1-6. doi:10.1016/0032-3861(96)81592-8.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-08E9-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-08EA-E

Genre: Journal Article

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Creators:
Göschel, U.¹, Author
Deutscher, K.¹, Author
Abetz, V.¹, Author

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1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 1996

Publication Status: Issued

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Identifiers: DOI: 10.1016/0032-3861(96)81592-8

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Title: Polymer

Other : Polymer

Source Genre: Journal

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Publ. Info: Guildford, England : Elsevier

Pages: - Volume / Issue: 37 (1) Sequence Number: - Start / End Page: 1 - 6 Identifier: ISSN: 0032-3861
CoNE: https://pure.mpg.de/cone/journals/resource/954925434439