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  FTIR Microscopy with Polarized Radiation for the Analysis of Adsorption Processes in Molecular Sieves

Schüth, F., Demuth, D., & Kallus, S. (1994). FTIR Microscopy with Polarized Radiation for the Analysis of Adsorption Processes in Molecular Sieves. In Studies in Surface Science and Catalysis (pp. 1223-1229). Amsterdam: Elsevier. doi:10.1016/S0167-2991(08)63661-7.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-4B47-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-4B48-9
Genre: Book Chapter

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 Creators:
Schüth, F.1, 2, Author           
Demuth, D.1, 2, Author           
Kallus, S.1, Author
Affiliations:
1Institut für Anorganische Chemie und Analytische Chemie der Johannes Gutenberg-Universität Mainz, ou_persistent22              
2Research Department Schüth, Max-Planck-Institut für Kohlenforschung, Max Planck Society, ou_1445589              

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 Abstract: FTIR Microscopy with polarized light was used to study the orientation of different molecules in Silicalite I, SAPO-5 and AlPO4-5 molecular sieves during the adsorption process and in their equilibrium positions. While the uptake and the equilibrium positions of p-xylene are essentially not influenced by the the framework charge, large differences between AlPO4-5 and SAPO-5 are observed with the strongly basic p-nitroaniline molecule.

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Language(s): eng - English
 Dates: 2008-05-231994
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/S0167-2991(08)63661-7
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Title: Studies in Surface Science and Catalysis
Source Genre: Series
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Publ. Info: Amsterdam : Elsevier
Pages: - Volume / Issue: 84 Sequence Number: - Start / End Page: 1223 - 1229 Identifier: ISSN: 0167-2991
CoNE: https://pure.mpg.de/cone/journals/resource/954926964942_2