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  Polarized Fourier Transform Infrared Microscopy as a Tool for Structural Analysis of Adsorbates in Molecular Sieves

Schüth, F. (1992). Polarized Fourier Transform Infrared Microscopy as a Tool for Structural Analysis of Adsorbates in Molecular Sieves. The Journal of Physical Chemistry, 96(19), 7493-7496. doi:10.1021/j100198a003.

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 Creators:
Schüth, F.1, Author           
Affiliations:
1lnstitut für Anorganische und Analytische Chemie, Johannes Gutenberg-Universität, 55099 Mainz, Germany, ou_persistent22              

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 Abstract: Using FTIR microscopy with polarized IR radiation on silicalite I single crystals fully loaded with p-xylene, the existence of an
ordered adsorbate could be proven for the
first time by IR spectroscopy.
By
analyzing
the
polarized absorption bands
the
orientation
of
the
p-xylene molecules relative to
the
host
structure
could
be
determined.
The
results
agree
well
with
structural
data
obtained
from
X-ray
diffraction experiments. These first results suggest
that
polarized
IR
microscopy
could
develop
into
a
powerful
tool
for
the
analysis
of
adsorbate structures, assisting
in
complete
structure
resolution
by
diffraction
techniques.

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Language(s): eng - English
 Dates: 1992-05-261992-09-01
 Publication Status: Issued
 Pages: 4
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1021/j100198a003
 Degree: -

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Title: The Journal of Physical Chemistry
  Abbreviation : J. Phys. Chem.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Washington, D.C. : American Chemical Society
Pages: - Volume / Issue: 96 (19) Sequence Number: - Start / End Page: 7493 - 7496 Identifier: ISSN: 1932-7447
CoNE: https://pure.mpg.de/cone/journals/resource/954926947766_3