Joint Characterization of Crystallography and Chemistry on the Nanometer Scale 
by Correlative Electron Microscopy and Atom Probe Tomography

Herbig, Michael

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Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography

Herbig, M. (2014). Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography. Talk presented at Seminar talk at the Institut für Metallkunde und Metallphysik, RWTH Aachen. Aachen, Germany. 2014-10-21.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-52FC-2 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-52FD-F

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Urheber:
Herbig, Michael¹, Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384