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  Tilt-Pair Analysis of Images from a Range of Different Specimens in Single-Particle Electron Cryomicroscopy

Henderson, R., Chen, S., Chen, J. Z., Grigorieff, N., Passmore, L. A., Ciccarelli, L., et al. (2011). Tilt-Pair Analysis of Images from a Range of Different Specimens in Single-Particle Electron Cryomicroscopy. Journal of Molecular Biology, 413(5), 1028-1046.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-D64B-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-D64C-7
Genre: Journal Article

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 Creators:
Henderson, Richard, Author
Chen, Shaoxia, Author
Chen, James Z., Author
Grigorieff, Nikolaus, Author
Passmore, Lori A., Author
Ciccarelli, Luciano1, Author           
Rubinstein, John L., Author
Crowther, R. Anthony, Author
Stewart, Phoebe L., Author
Rosenthal, Peter B., Author
Affiliations:
1Department of Structural Biology, Max Planck Institute of Biophysics, Max Planck Society, ou_2068291              

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Free keywords: electron microscopy; structure validation; particle orientation; beam-induced specimen motion; radiation damage
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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 575384
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Title: Journal of Molecular Biology
  Alternative Title : J. Mol. Biol.
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 413 (5) Sequence Number: - Start / End Page: 1028 - 1046 Identifier: -