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  Origins of electrostatic potential wells at dislocations in polycrystalline Cu(In,Ga)Se2 thin films

Dietrich, J., Abou-Ras, D., Schmidt, S. S., Rissom, T., Unold, T., Cojocaru-Mirédin, O., et al. (2014). Origins of electrostatic potential wells at dislocations in polycrystalline Cu(In,Ga)Se2 thin films. Journal of Applied Physics, 115(10): 103507. doi:10.1063/1.4867398.

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 Creators:
Dietrich, Jens1, 2, Author           
Abou-Ras, Daniel2, Author           
Schmidt, Sebastian S.2, Author           
Rissom, T.2, Author           
Unold, Thomas2, Author           
Cojocaru-Mirédin, Oana3, Author           
Niermann, Tore4, Author           
Lehmann, Michael M.4, Author           
Koch, Christoph T.5, Author           
Boit, Christian6, Author           
Affiliations:
1Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, 14109 Berlin, Germany , Technische Universität Berlin, Einsteinufer 19, 10587 Berlin, Germany, ou_persistent22              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
3Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387              
4Institut für Optik und Atomare Physik, Technische Universität Berlin, Sekretariat ER 1-1, Strasse des 17, Juni 135, 10623 Berlin, Germany, ou_persistent22              
5Institut für Experimentelle Physik, Universität Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany, ou_persistent22              
6Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, 14109 Berlin, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2014-03-14
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1063/1.4867398
 Degree: -

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Title: Journal of Applied Physics
  Abbreviation : J. Appl. Phys.
Source Genre: Journal
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Pages: - Volume / Issue: 115 (10) Sequence Number: 103507 Start / End Page: - Identifier: ISSN: 0021-8979
CoNE: https://pure.mpg.de/cone/journals/resource/991042723401880