English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography

Stoffers, A., Cojocaru-Mirédin, O., Breitenstein, O., Seifert, W., Zaefferer, S., & Raabe, D. (2014). Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 (pp. 42-46).

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-90C8-8 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-90C9-6
Genre: Conference Paper

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Stoffers, Andreas1, Author              
Cojocaru-Mirédin, Oana1, Author              
Breitenstein, Otwin2, Author              
Seifert, Winfried3, 4, Author              
Zaefferer, Stefan5, Author              
Raabe, Dierk6, Author              
Affiliations:
1Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387              
2Brandenburgische Technische Universitat, Platz der Deutschen Einheit 1, Cottbus, Germany, ou_persistent22              
3Brandenburgische Technische Universität, Platz der Deutschen Einheit 1, Cottbus, Germany, ou_persistent22              
4IHP, Im Technologiepark 25Frankfurt (Oder), Germany, ou_persistent22              
5Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
6Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2014-10-15
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1109/PVSC.2014.6925089
 Degree: -

Event

show
hide
Title: 40th IEEE Photovoltaic Specialist Conference, PVSC 2014
Place of Event: Denver, CO, USA
Start-/End Date: 2014-06-08 - 2014-06-13

Legal Case

show

Project information

show

Source 1

show
hide
Title: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: 6925089 Start / End Page: 42 - 46 Identifier: ISBN: 978-147994398-2
Other: Category numberCFP14PSC-ART
Other: Code 108691