Grain boundary characterization in multicrystalline silicon using joint EBSD, 
EBIC, and atom probe tomography

Stoffers, Andreas; Cojocaru-Mirédin, Oana; Breitenstein, Otwin; Seifert, Winfried; Zaefferer, Stefan; Raabe, Dierk

doi:10.1109/PVSC.2014.6925089

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Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography

Stoffers, A., Cojocaru-Mirédin, O., Breitenstein, O., Seifert, W., Zaefferer, S., & Raabe, D. (2014). Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 (pp. 42-46).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-90C8-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-90C9-6

Genre: Conference Paper

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Creators:
Stoffers, Andreas¹, Author
Cojocaru-Mirédin, Oana¹, Author
Breitenstein, Otwin², Author
Seifert, Winfried^{3, 4}, Author
Zaefferer, Stefan⁵, Author
Raabe, Dierk⁶, Author

Affiliations:
1Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387
2Brandenburgische Technische Universitat, Platz der Deutschen Einheit 1, Cottbus, Germany, ou_persistent22
3Brandenburgische Technische Universität, Platz der Deutschen Einheit 1, Cottbus, Germany, ou_persistent22
4IHP, Im Technologiepark 25Frankfurt (Oder), Germany, ou_persistent22
5Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
6Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Date issued: 2014-10-15

Publication Status: Issued

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Identifiers: DOI: 10.1109/PVSC.2014.6925089

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Title: 40th IEEE Photovoltaic Specialist Conference, PVSC 2014

Place of Event: Denver, CO, USA

Start-/End Date: 2014-06-08 - 2014-06-13

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Title: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Source Genre: Proceedings

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Pages: - Volume / Issue: - Sequence Number: 6925089 Start / End Page: 42 - 46 Identifier: ISBN: 978-147994398-2
Other: Category numberCFP14PSC-ART
Other: Code 108691