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  Thickness dependent exchange bias in martensitic epitaxial Ni–Mn–Sn thin films

Behler, A., Teichert, N., Dutta, B., Waske, A., Hickel, T., Auge, A., et al. (2013). Thickness dependent exchange bias in martensitic epitaxial Ni–Mn–Sn thin films. AIP Advances, 3(12): 122112. doi:10.1063/1.4849795.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-B37A-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-B37F-7
Genre: Journal Article

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 Creators:
Behler, Anna1, 2, Author              
Teichert, Niclas3, Author              
Dutta, Biswanath4, Author              
Waske, Anja1, Author              
Hickel, Tilmann4, Author              
Auge, Alexander3, Author              
Hütten, Andreas3, Author              
Eckert, Jürgen1, 5, Author              
Affiliations:
1IFW Dresden, Institute for Complex Materials, P.O. Box 27 01 16, 01171 Dresden, Germany, ou_persistent22              
2Department of Physics, Institute for Solid State Physics, Dresden University of Technology, 01062 Dresden, Germany, ou_persistent22              
3Department of Physics, Thin Films and Physics of Nanostructures, Bielefeld University, 33501 Bielefeld, Germany, ou_persistent22              
4Computational Phase Studies, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863341              
5TU Dresden, Institute of Materials Science, Helmholtzstr. 7, 01069 Dresden, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2013-09-052013-12-022013-12-102013
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1063/1.4849795
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Title: AIP Advances
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 3 (12) Sequence Number: 122112 Start / End Page: - Identifier: DOI: 10.1063/1.4849795