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  Field emission beam characteristics of a double-gate single nanoemitter

Lee, C., Kanungo, P. D., Guzenko, V., Hefenstein, P., Tsujino, S., Kassier, G., et al. (2014). Field emission beam characteristics of a double-gate single nanoemitter. In 27th International Vacuum Nanoelectronics Conference (IVNC), 2014 (pp. 167-168). IEEE.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-BE08-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002A-DBF1-8
Genre: Conference Paper

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Locator:
https://dx.doi.org/10.1109/IVNC.2014.6894795 (Publisher version)
Description:
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 Creators:
Lee, C.1, Author
Kanungo, P. D.1, Author
Guzenko, V.1, Author
Hefenstein, P.1, Author
Tsujino, S.1, Author
Kassier, G.2, Author              
Casandruc, Albert2, 3, Author              
Miller, R. J. D.2, Author              
Affiliations:
1Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, CH-5232 Villigen-PSI, Switzerland, ou_persistent22              
2Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938288              
3International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_2266714              

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Free keywords: brightness; double-gated field emitter; electron beam collimation; field emission
 Abstract: We study field emission characteristics of an allmetal double-gate single nanotip emitter to explore the feasibility of such emitters for applications that require extremely high beam brightness and coherence. The single-tip device showed an excellent beam collimation characteristic including an order of magnitude reduction of the transverse velocity spread and an order of magnitude enhancement of beam intensity as reported with array devices previously. The evolution of the beam image with the increase of the collimation potential indicated the importance of subnanometer corrugation at the nanotip apex surface.

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Language(s): eng - English
 Dates: 2014
 Publication Status: Published in print
 Pages: 2
 Publishing info: -
 Table of Contents: -
 Rev. Method: Internal
 Identifiers: BibTex Citekey: Lee2014167
DOI: 10.1109/IVNC.2014.6894795
 Degree: -

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Title: 27th International Vacuum Nanoelectronics Conference (IVNC)
Place of Event: Engelberg, Switzerland
Start-/End Date: 2014-07-06 - 2014-07-10

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Title: 27th International Vacuum Nanoelectronics Conference (IVNC), 2014
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 167 - 168 Identifier: ISBN: 978-1-4799-5306-6