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  Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder

Beyerlein, K. R., Jooss, C., Barty, A., Bean, R., Boutet, S., Dhesi, S. S., et al. (2015). Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder. Powder Diffraction, 30(S1), 25-30. doi:10.1017/S0885715614001171.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-C311-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0027-AA39-F
Genre: Journal Article

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https://dx.doi.org/10.1017/S0885715614001171 (Publisher version)
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 Creators:
Beyerlein, K. R.1, Author
Jooss, C., Author
Barty, A.1, Author
Bean, R.1, Author
Boutet, S., Author
Dhesi, S. S., Author
Doak, R. B., Author
Först, M.2, Author              
Galli, L.1, 3, Author
Kirian, R. A.1, Author
Kozak, J., Author
Lang, M., Author
Mankowsky, R.2, Author              
Messerschmidt, M., Author
Spence, J. C. H., Author
Wang, D., Author
Weierstall, U., Author
White, T. A.1, Author
Williams, G. J., Author
Yefanov, O.1, Author
Zatsepin, N. A., AuthorCavalleri, A.2, 3, Author              Chapman, H. N.1, 3, 4, Author more..
Affiliations:
1Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany , ou_persistent22              
2Quantum Condensed Matter Dynamics, Condensed Matter Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938293              
3Department of Physics, University of Hamburg, Jungiusstr. 6, 20355 Hamburg, Germany , ou_persistent22              
4Centre for Ultrafast Imaging, Luruper Chaussee 149, 22607 Hamburg, Germany , ou_persistent22              

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Free keywords: nanocrystalline materials, serial crystallography, trace phase detection, strain characterization, X-ray free-electron lasers, manganite, quantitative phase analysis
 Abstract: We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each highlights. Analysis of SFX data from a powder of Pr0.5Ca0.5MnO3 in this way finds evidence of other trace phases in its microstructure which was not detectable in a standard powder-diffraction measurement. Furthermore, a comparison between two virtual powder pattern integration strategies is shown to yield different diffraction peak broadening, indicating sensitivity to different types of microstrain. This paper is a first step in developing new data analysis methods for microstructure characterization from serial crystallography data.

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Language(s): eng - English
 Dates: 2014-09-302014-10-212014-11-172015-06
 Publication Status: Published in print
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: BibTex Citekey: Beyerlein2014
DOI: 10.1017/S0885715614001171
 Degree: -

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Title: Powder Diffraction
Source Genre: Journal
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Publ. Info: [Swarthmore, Pa. : JCPDS--International Centre for Diffraction Data
Pages: - Volume / Issue: 30 (S1) Sequence Number: - Start / End Page: 25 - 30 Identifier: ISSN: 0885-7156
CoNE: /journals/resource/954925551361