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  Measuring the Three-Dimensional Structure of Ultrathin Insulating Films at the Atomic Scale

Baumann, S., Rau, I. G., Loth, S., Lutz, C. P., & Heinrich, A. J. (2014). Measuring the Three-Dimensional Structure of Ultrathin Insulating Films at the Atomic Scale. ACS Nano, 8(2), 1739-1744. doi:10.1021/nn4061034.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-BDF7-D Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0026-B2FD-9
Genre: Journal Article

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http://dx.doi.org/10.1021/nn4061034 (Publisher version)
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 Creators:
Baumann, Susanne1, 2, Author
Rau, Ileana G.1, Author
Loth, S.3, 4, Author              
Lutz, Christopher P.1, Author
Heinrich, Andreas J.1, Author
Affiliations:
1 IBM Almaden Research Center, 650 Harry Road, San Jose, California 95120, United States, ou_persistent22              
2Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland, ou_persistent22              
3Dynamics of Nanoelectronic Systems, Independent Research Groups, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938290              
4Max Planck Institute for Solid State Research, 70569 Stuttgart, Germany, ou_persistent22              

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Free keywords: magnesium oxide; atomic force microscopy; conductive AFM; scanning tunneling microscopy; thickness determination; thin oxide films; thin insulating films
 Abstract: The increasing technological importance of thin insulating layers calls for a thorough understanding of their structure. Here we apply scanning probe methods to investigate the structure of ultrathin magnesium oxide (MgO) which is the insulating material of choice in spintronic applications. A combination of force and current measurements gives high spatial resolution maps of the local three-dimensional insulator structure. When force measurements are not available, a lower spatial resolution can be obtained from tunneling images at different voltages. These broadly applicable techniques reveal a previously unknown complexity in the structure of MgO on Ag(001), such as steps in the insulator–metal interface.

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Language(s): eng - English
 Dates: 2013-11-272013-12-302013-12-302014-02-25
 Publication Status: Published in print
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1021/nn4061034
BibTex Citekey: doi:10.1021/nn4061034
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Title: ACS Nano
Source Genre: Journal
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Affiliations:
Publ. Info: Washington, DC : American Chemical Society
Pages: - Volume / Issue: 8 (2) Sequence Number: - Start / End Page: 1739 - 1744 Identifier: Other: 1936-0851
CoNE: /journals/resource/1936-0851