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  A lifespan comparison of the reliability, test-retest stability and signal-to-noise ratio of event-related potentials assessed during performance monitoring

Hämmerer, D., Li, S.-C., Voelkle, M. C., Müller, V., & Lindenberger, U. (2013). A lifespan comparison of the reliability, test-retest stability and signal-to-noise ratio of event-related potentials assessed during performance monitoring. Psychophysiology, 50(1), 111-123. doi:10.1111/j.1469-8986.2012.01476.x.

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DH_Lifespan_2013.pdf (Publisher version), 520KB
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 Creators:
Hämmerer, Dorothea1, Author              
Li, Shu-Chen1, Author              
Voelkle, Manuel C.1, Author              
Müller, Viktor1, Author              
Lindenberger, Ulman1, Author              
Affiliations:
1Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society, ou_2074288              

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Language(s): eng - English
 Dates: 2013
 Publication Status: Published in print
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 655925
DOI: 10.1111/j.1469-8986.2012.01476.x
Other: alg:id10004497
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Title: Psychophysiology
Source Genre: Journal
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Pages: - Volume / Issue: 50 (1) Sequence Number: - Start / End Page: 111 - 123 Identifier: -