English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Chemistry-dependent X-ray-induced surface charging

Salgin, B., Pontoni, D., Vogel, D., Schröder, H., Keil, P., Stratmann, M., et al. (2014). Chemistry-dependent X-ray-induced surface charging. Physical Chemistry Chemical Physics, 16(40), 22255-22261. doi:10.1039/c4cp02295e.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-D32D-3 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-C2F0-2
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Salgin, Bekir1, Author              
Pontoni, Diego2, Author              
Vogel, Dirk1, Author              
Schröder, Heiko3, 4, Author              
Keil, Patrick1, 5, Author              
Stratmann, Martin6, Author              
Reichert, Harald G.2, 3, Author              
Rohwerder, Michael1, Author              
Affiliations:
1Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2074315              
2European Synchrotron Radiation Facility, Grenoble Cedex, France, ou_persistent22              
3Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              
4Tesat-Spacecom GmbH and Co. KG, Gerberstrasse 49, Backnang, Germany, ou_persistent22              
5BASF, Ludwigshafen, Germany , ou_persistent22              
6Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348              

Content

show
hide
Free keywords: Contact-Potential-Difference; Synchrotron-Radiation; Photoemission-Spectroscopy; Protein Crystals; Kelvin Probe; Damage; Photovoltage; Interfaces; Crystallography; Adsorption; Chemistry; Physics;
 Abstract: Materials science in general, and surface/interface science in particular, have greatly benefited from the development of high energy synchrotron radiation facilities. Irradiation with intense ionizing beams can however influence relevant sample properties. Permanent radiation damage and irradiation-induced sample modifications have been investigated in detail during the last decades. Conversely, reversible sample alterations taking place only during irradiation are still lacking comprehensive in situ characterization. Irradiation-induced surface charging phenomena are particularly relevant for a wide range of interface science investigations, in particular those involving surfaces of solid substrates in contact with gaseous or liquid phases. Here, we demonstrate partially reversible radiation-induced surface charging phenomena, which extend far beyond the spatial dimensions of the X-ray beam mainly as a consequence of the interaction between the surface and ionized ambient molecules. The charging magnitude and sign are found to be surface chemistry specific and dependent on the substrates' bulk conductivity and grounding conditions. These results are obtained by combining a scanning Kelvin probe with a synchrotron surface diffractometer to allow simultaneous in situ work function measurements during precisely controlled hard X-ray micro-beam irradiation.

Details

show
hide
Language(s): eng - English
 Dates: 2014-10-28
 Publication Status: Published in print
 Pages: 7
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: ISI: 000343072800037
DOI: 10.1039/c4cp02295e
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Physical Chemistry Chemical Physics
  Abbreviation : Phys. Chem. Chem. Phys.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Cambridge, England : Royal Society of Chemistry
Pages: - Volume / Issue: 16 (40) Sequence Number: - Start / End Page: 22255 - 22261 Identifier: ISSN: 1463-9076
CoNE: /journals/resource/954925272413_1