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  Chemistry-dependent X-ray-induced surface charging

Salgin, B., Pontoni, D., Vogel, D., Schröder, H., Keil, P., Stratmann, M., et al. (2014). Chemistry-dependent X-ray-induced surface charging. Physical Chemistry Chemical Physics, 16(40), 22255-22261. doi:10.1039/c4cp02295e.

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 Creators:
Salgin, Bekir1, Author           
Pontoni, Diego2, Author           
Vogel, Dirk1, Author           
Schröder, Heiko3, 4, Author           
Keil, Patrick1, 5, Author           
Stratmann, Martin6, Author           
Reichert, Harald G.2, 3, Author           
Rohwerder, Michael1, Author           
Affiliations:
1Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2074315              
2European Synchrotron Radiation Facility, Grenoble Cedex, France, ou_persistent22              
3Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              
4Tesat-Spacecom GmbH and Co. KG, Gerberstrasse 49, Backnang, Germany, ou_persistent22              
5BASF, Ludwigshafen, Germany , ou_persistent22              
6Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348              

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Free keywords: Contact-Potential-Difference; Synchrotron-Radiation; Photoemission-Spectroscopy; Protein Crystals; Kelvin Probe; Damage; Photovoltage; Interfaces; Crystallography; Adsorption; Chemistry; Physics;
 Abstract: Materials science in general, and surface/interface science in particular, have greatly benefited from the development of high energy synchrotron radiation facilities. Irradiation with intense ionizing beams can however influence relevant sample properties. Permanent radiation damage and irradiation-induced sample modifications have been investigated in detail during the last decades. Conversely, reversible sample alterations taking place only during irradiation are still lacking comprehensive in situ characterization. Irradiation-induced surface charging phenomena are particularly relevant for a wide range of interface science investigations, in particular those involving surfaces of solid substrates in contact with gaseous or liquid phases. Here, we demonstrate partially reversible radiation-induced surface charging phenomena, which extend far beyond the spatial dimensions of the X-ray beam mainly as a consequence of the interaction between the surface and ionized ambient molecules. The charging magnitude and sign are found to be surface chemistry specific and dependent on the substrates' bulk conductivity and grounding conditions. These results are obtained by combining a scanning Kelvin probe with a synchrotron surface diffractometer to allow simultaneous in situ work function measurements during precisely controlled hard X-ray micro-beam irradiation.

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Language(s): eng - English
 Dates: 2014-10-28
 Publication Status: Issued
 Pages: 7
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 000343072800037
DOI: 10.1039/c4cp02295e
 Degree: -

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Title: Physical Chemistry Chemical Physics
  Abbreviation : Phys. Chem. Chem. Phys.
Source Genre: Journal
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Publ. Info: Cambridge, England : Royal Society of Chemistry
Pages: - Volume / Issue: 16 (40) Sequence Number: - Start / End Page: 22255 - 22261 Identifier: ISSN: 1463-9076
CoNE: https://pure.mpg.de/cone/journals/resource/954925272413_1