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  Domain wall pinning in ultra-narrow electromigrated break junctions

Reeve, R. M., Loescher, A., Mawass, M.-A., Hoffmann-Vogel, R., & Kläui, M. (2014). Domain wall pinning in ultra-narrow electromigrated break junctions. Journal of Physics: Condensed Matter, 26(47): 474207. doi:10.1088/0953-8984/26/47/474207.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-7B1F-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-7B20-F
Genre: Journal Article

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 Creators:
Reeve, R. M.1, Author
Loescher, A.1, Author
Mawass, M.-A.2, Author           
Hoffmann-Vogel, R.3, Author
Kläui, M.1, Author
Affiliations:
1Institut für Physik, Johannes Gutenberg-Universität Mainz, 55099 Mainz, Germany, ou_persistent22              
2Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648              
3Physikalisches Institut and DFG-Center for Functional Nanostructures, Karlsruhe Institute of Technology, Campus South, 76128 Karlsruhe, Germany, ou_persistent22              

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Free keywords: Abt. Schütz
 Abstract: -

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Language(s): eng - English
 Dates: 2014
 Publication Status: Published in print
 Pages: 9
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1088/0953-8984/26/47/474207
 Degree: -

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Title: Journal of Physics: Condensed Matter
  Abbreviation : J. Phys.: Condens. Matter
Source Genre: Journal
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Publ. Info: Bristol : IOP Publishing
Pages: - Volume / Issue: 26 (47) Sequence Number: 474207 Start / End Page: - Identifier: ISSN: 0953-8984
CoNE: https://pure.mpg.de/cone/journals/resource/954928562478