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  Effects of the film thickness on the deformation behavior of thin Cu films on polyimide

Marx, V. M., Kirchlechner, C., Cordill, M. J., & Dehm, G. (2014). Effects of the film thickness on the deformation behavior of thin Cu films on polyimide. Talk presented at Arbeitskreistreffen Rasterkraftmikroskopie und nanomechanische Methoden, Max-Planck-Institut für Eisenforschung GmbH. Düsseldorf, Germany. 2014-02-27 - 2014-02-28.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-A2A2-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-AE22-8
Genre: Talk

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 Creators:
Marx, Vera Maria1, Author              
Kirchlechner, Christoph2, Author              
Cordill, Megan Jo3, Author              
Dehm, Gerhard4, Author              
Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
2Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
3Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22              
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2014-02
 Publication Status: Not specified
 Pages: -
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Title: Arbeitskreistreffen Rasterkraftmikroskopie und nanomechanische Methoden, Max-Planck-Institut für Eisenforschung GmbH
Place of Event: Düsseldorf, Germany
Start-/End Date: 2014-02-27 - 2014-02-28

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