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  Quantitative Tiefenprofilierung durch XPS – Ein neuer Ansatz in der Oberflächenanalyse realer Materialien

Merzlikin, S. V., Grünert, W., Strunskus, T., Witte, G., Wachs, I. E., Wöll, C. H., et al. (2007). Quantitative Tiefenprofilierung durch XPS – Ein neuer Ansatz in der Oberflächenanalyse realer Materialien. Talk presented at 49.Jahrestreffen Deutscher Katalytiker, DECHEMA, 2007. Weimar, Germany. 2007-03-14 - 2007-03-16.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-0878-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-087A-7
Genre: Talk

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 Creators:
Merzlikin, Sergiy Vasil´ović1, Author              
Grünert, Wolfgang1, Author              
Strunskus, Thomas2, Author              
Witte, Gregor3, Author              
Wachs, Israel E.4, Author              
Wöll, Christof H.3, Author              
Tolkachev, Nikolay N.5, Author              
Tkachenko, O. P.5, Author              
Affiliations:
1Lehrstuhl für Technische Chemie, Ruhr-Universität Bochum, Postfach 102148, 44780 Bochum, Germany, ou_persistent22              
2Lehrstuhl Physikalische Chemie, Ruhr-Universität, Bochum, Germany, ou_persistent22              
3Laboratory of Physical Chemistry I, Ruhr University Bochum, D-44780 Bochum, Germany, ou_persistent22              
4Operando Molecular Spectroscopy and Catalysis Laboratory, Department of Chemical Engineering, Lehigh University, Bethlehem, PA 18015, USA, ou_persistent22              
5N. D. Zelinsky Institute of Organic Chemistry, Russian Academy of Sciences, Moscow, Russia, ou_persistent22              

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Language(s): eng - English
 Dates: 2007
 Publication Status: Not specified
 Pages: -
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 Rev. Method: -
 Identifiers: -
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Title: 49.Jahrestreffen Deutscher Katalytiker, DECHEMA, 2007
Place of Event: Weimar, Germany
Start-/End Date: 2007-03-14 - 2007-03-16

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