Further development of depth differentiation X-ray photoelectron spectroscopy 
(XPS)

Merzlikin, Sergiy Vasil´ović; Grünert, Wolfgang; Tolkachev, Nikolay N.; Strunskus, Thomas; Wöll, Christof H.

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Further development of depth differentiation X-ray photoelectron spectroscopy (XPS)

Merzlikin, S. V., Grünert, W., Tolkachev, N. N., Strunskus, T., & Wöll, C. H. (2006). Further development of depth differentiation X-ray photoelectron spectroscopy (XPS). Poster presented at 39.Jahrestreffen Deutscher Katalytiker, DECHEMA, 2006, Weimar, Germany.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-087E-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-0880-8

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Creators:
Merzlikin, Sergiy Vasil´ović¹, Author
Grünert, Wolfgang¹, Author
Tolkachev, Nikolay N.², Author
Strunskus, Thomas³, Author
Wöll, Christof H.⁴, Author

Affiliations:
1Lehrstuhl für Technische Chemie, Ruhr-Universität Bochum, Postfach 102148, 44780 Bochum, Germany, ou_persistent22
2N. D. Zelinsky Institute of Organic Chemistry, Russian Academy of Sciences, Moscow, Russia, ou_persistent22
3Lehrstuhl Physikalische Chemie, Ruhr-Universität, Bochum, Germany, ou_persistent22
4Laboratory of Physical Chemistry I, Ruhr University Bochum, D-44780 Bochum, Germany, ou_persistent22

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Language(s): eng - English

Dates: Created: 2006

Publication Status: Not specified

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Title: 39.Jahrestreffen Deutscher Katalytiker, DECHEMA, 2006

Place of Event: Weimar, Germany

Start-/End Date: 2006-03-15 - 2006-03-17

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