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  Polarization dependent hard X-ray photoemission experiments for solids: Efficiency and limits for unraveling the orbital character of the valence band

Weinen, J., Koethe, T. C., Chang, C. F., Agrestini, S., Kasinathan, D., Liao, Y. F., et al. (2015). Polarization dependent hard X-ray photoemission experiments for solids: Efficiency and limits for unraveling the orbital character of the valence band. Journal of Electron Spectroscopy and Related Phenomena, 198, 6-11. doi:10.1016/j.elspec.2014.11.003.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-09C1-C Version Permalink: http://hdl.handle.net/21.11116/0000-0000-617E-6
Genre: Journal Article

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 Creators:
Weinen, J.1, Author              
Koethe, T. C.2, Author
Chang, C. F.3, Author              
Agrestini, S.4, Author              
Kasinathan, D.1, Author              
Liao, Y. F.2, Author
Fujiwara, H.2, Author
Schüßler-Langeheine, C.2, Author
Strigari, F.2, Author
Haupricht, T.2, Author
Panaccione, G.2, Author
Offi, F.2, Author
Monaco, G.2, Author              
Huotari, S.2, Author
Tsuei, K.-D.2, Author
Tjeng, L. H.5, Author              
Affiliations:
1Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863445              
2External Organizations, ou_persistent22              
3Chun-Fu Chang, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863447              
4Stefano Agrestini, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863459              
5Liu Hao Tjeng, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863452              

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 Abstract: We have investigated the efficiency and limits of polarization dependent hard X-ray photoelectron spectroscopy (HAXPES) in order to establish how well this method can be used to unravel quantitatively the contributions of the orbitals forming the valence band of solids. By rotating the energy analyzer rather than the polarization vector of the light using a phase retarder, we obtained the advantage that the full polarization of the light is available for the investigation. Using NiO, ZnO, and Cu2O as examples for solid state materials, we established that the polarization dependence is much larger than in photoemission experiments utilizing ultra-violet or soft X-ray light. Yet we also have discovered that the polarization dependence is less than complete on the basis of atomic calculations, strongly suggesting that the trajectories of the outgoing electrons are affected by appreciable side-scattering processes even at these high kinetic energies. We have found in our experiment that these can be effectively described as a directional spread of +/- 18 degrees of the photoelectrons. This knowledge allows us to identify, for example, reliably the Ni 3d spectral weight of the NiO valence band and at the same time to demonstrate the importance of the Ni 4s for the chemical stability of the compound. (C) 2014 Elsevier B.V. All rights reserved.

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Language(s): eng - English
 Dates: 2015-02-152015-02-15
 Publication Status: Published in print
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Title: Journal of Electron Spectroscopy and Related Phenomena
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier B.V.
Pages: - Volume / Issue: 198 Sequence Number: - Start / End Page: 6 - 11 Identifier: ISSN: 0368-2048
CoNE: https://pure.mpg.de/cone/journals/resource/954925524767