The Scanning Kelvin Probe as a New Technique to Analyze Buried Interfaces

Rohwerder, Michael; Stratmann, Martin

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The Scanning Kelvin Probe as a New Technique to Analyze Buried Interfaces

Rohwerder, M., & Stratmann, M. (1999). The Scanning Kelvin Probe as a New Technique to Analyze Buried Interfaces. Talk presented at 196th meeting of the ECS. Honolulu, USA. 1999-10-17 - 1999-10-22.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-752C-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-752D-1

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Creators:
Rohwerder, Michael¹, Author
Stratmann, Martin², Author

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1Institut für Werkstoffwissenschaften IV, Universität Erlangen, 91058 Erlangen, Germany, ou_persistent22
2Institut für Werkstoffwissenschaften IV, Universität Erlangen, Erlangen, D-91058, Germany, ou_persistent22

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Free keywords: Presenter: Rohwerder, M.

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Language(s): eng - English

Dates: Created: 1999-10

Publication Status: Not specified

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Title: 196th meeting of the ECS

Place of Event: Honolulu, USA

Start-/End Date: 1999-10-17 - 1999-10-22

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