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  Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn-Ga films

ViolBarbosa, C. E., Ouardi, S., Kubota, T., Mizukami, S., Fecher, G. H., Miyazaki, T., et al. (2015). Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn-Ga films. Applied Physics Letters, 106(5): 052402, pp. 1-5. doi:10.1063/1.4907537.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-AF64-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-F7F5-E
Genre: Journal Article

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 Creators:
ViolBarbosa, Carlos E.1, Author              
Ouardi, Siham2, Author              
Kubota, Takahide3, Author
Mizukami, Shigemi3, Author
Fecher, Gerhard H.4, Author              
Miyazaki, Terunobu3, Author
Ikenaga, Eiji3, Author
Felser, Claudia5, Author              
Affiliations:
1Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863425              
2Siham Ouardi, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863439              
3External Organizations, ou_persistent22              
4Gerhard Fecher, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863431              
5Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863429              

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 Abstract: X-ray photoelectron diffraction (XPD) in combination with hard X-ray photoelectron spectroscopy (HAXPES) has been used to study the structure of buried layers in thin multilayer films. A detailed layer-by-layer investigation was performed using the element-specific, local-probe character of XPD. In the present work, angular-resolved HAXPES at a photon energy of 7.94 keV photon energy was used to investigate a Cr/Mn62Ga38/Mg/MgO multilayer system. Differences in the angular distributions of electrons emitted from Mn and Ga atoms revealed that the structure of Mn62Ga38 changes from L1(0) towards D0(22) for increasing annealing temperatures. A c/a ratio of 1.81+/-0.06 was determined for the buried Mn62Ga38 layer in a D0(22) structure from the XPD experiment. The improvement of the structural order of the Mn62Ga38 layer is accompanied by an improvement of the structure of the overlying MgO layer. (C) 2015 AIP Publishing LLC.

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Language(s): eng - English
 Dates: 2015-02-022015-03-15
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: ISI: 000349611800034
DOI: 10.1063/1.4907537
 Degree: -

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Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
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Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 106 (5) Sequence Number: 052402 Start / End Page: 1 - 5 Identifier: Other: 0003-6951
CoNE: /journals/resource/954922836223