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  Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids

Eckert, S., Beye, M., Pietzsch, A., Quevedo, W., Hantschmann, M., Ochmann, M., et al. (2015). Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids. Applied Physics Letters, 106(6): 061104. doi:10.1063/1.4907949.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-A155-A Version Permalink: https://hdl.handle.net/21.11116/0000-0007-15B0-A
Genre: Journal Article

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 Creators:
Eckert, S.1, Author
Beye, M.1, Author
Pietzsch, A.1, Author
Quevedo, W.1, Author
Hantschmann, M.1, Author
Ochmann, Miguel2, 3, 4, Author           
Ross, M.5, Author
Minitti, M. P.6, Author
Turner, J. J.6, Author
Moeller, S. P.6, Author
Schlotter, W. F.6, Author
Dakovski, G. L.6, Author
Khalil, M.5, Author
Huse, Nils2, 3, 4, Author           
Föhlisch, A.1, 7, Author
Affiliations:
1Institute for Methods and Instrumentation in Synchrotron Radiation Research, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin, Germany, ou_persistent22              
2Institute for Nanostructure and Solid State Physics, University of Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany, ou_persistent22              
3Ultrafast Molecular Dynamics, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938289              
4Center for Free-Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg, Germany, ou_persistent22              
5Department of Chemistry, University of Washington, Box 351700, Seattle, Washington 98195, USA, ou_persistent22              
6LCLS, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, USA, ou_persistent22              
7Institut f€ur Physik und Astronomie, Universit€at Potsdam, Karl-Liebknecht-Str. 24/25, 14476 Potsdam, Germany, ou_persistent22              

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Free keywords: Reflectivity; X-ray reflectometry; Refractive index; X-ray detectors; Photons
 Abstract: The discovery of ultrafast X-ray induced optical reflectivity changes enabled the development of X-ray/optical cross correlation techniques at X-ray free electron lasers worldwide. We have now linked through experiment and theory the fundamental excitation and relaxation steps with the transient optical properties in finite solid samples. Therefore, we gain a thorough interpretation and an optimized detection scheme of X-ray induced changes to the refractive index and the X-ray/optical cross correlation response.

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Language(s): eng - English
 Dates: 2015-01-202015-01-302015-02-102015-02-09
 Publication Status: Issued
 Pages: 4
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1063/1.4907949
 Degree: -

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Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
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Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 106 (6) Sequence Number: 061104 Start / End Page: - Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223