Joint crystallographic and chemical characterization at the nanometer scale by 
correlative TEM and atom probe tomography

Herbig, Michael; Raabe, Dierk; Li, Yujiao; Choi, Pyuck-Pa; Zaefferer, Stefan; Goto, Shoji

Lokale TagsFreigabegeschichteDetailsÜbersicht

Joint crystallographic and chemical characterization at the nanometer scale by correlative TEM and atom probe tomography

Herbig, M., Raabe, D., Li, Y., Choi, P.-P., Zaefferer, S., & Goto, S. (2014). Joint crystallographic and chemical characterization at the nanometer scale by correlative TEM and atom probe tomography. Talk presented at Workshop: White-etching layers in ball and roller bearings, Informatik-Zentrum Hörn. Aachen, Germany. 2014-11-18.

Item is Freigegeben

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:

Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-A482-A Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-A483-8

Genre: Vortrag

ausblenden:

Urheber:
Herbig, Michael¹, Autor
Raabe, Dierk², Autor
Li, Yujiao³, Autor
Choi, Pyuck-Pa¹, Autor
Zaefferer, Stefan⁴, Autor
Goto, Shoji², Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
3Alloy Design and Thermomechanical Processing, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863383
4Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391