English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Computational simulation of cracking and buckling of thin metallic films on polymer substrate under tensile loading

Toth, F., Wiesinger, A., Cordill, M. J., Marx, V. M., & Rammerstorfer, F. G. (2014). Computational simulation of cracking and buckling of thin metallic films on polymer substrate under tensile loading. Talk presented at "Mechanical Issues for Flexible Electronics" Flex Workshop, Erich Schmid Institut, Leoben. Leoben, Austria. 2014-04-10 - 2014-04-11.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-A2A2-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-AE44-B
Genre: Talk

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Toth, Florian1, Author              
Wiesinger, Andreas1, Author              
Cordill, Megan Jo2, Author              
Marx, Vera Maria3, Author              
Rammerstorfer, Franz Georg4, Author              
Affiliations:
1Institute of Lightweight Design and Structural Biomechanics, Vienna University of Technology, Gußhausstr. 27-29, Vienna, Austria, ou_persistent22              
2Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22              
3Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
4Department Material Physics, Montanuniversität Leoben, Jahnstr. 12, Leoben, Austria, ou_persistent22              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2014-04
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: "Mechanical Issues for Flexible Electronics" Flex Workshop, Erich Schmid Institut, Leoben
Place of Event: Leoben, Austria
Start-/End Date: 2014-04-10 - 2014-04-11

Legal Case

show

Project information

show

Source

show