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  In-situ stress measurements in thin films using synchrotron diffraction

Marx, V. M., Cordill, M. J., Kirchlechner, C., & Dehm, G. (2014). In-situ stress measurements in thin films using synchrotron diffraction. Talk presented at Summer School: Theory and Practice of Modern Powder Diffraction, Tagungshaus Schönenberg, Ellwangen. Ellwangen, Germany. 2014-10-05 - 2014-10-08.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-A2A2-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-AE1E-3
Genre: Talk

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 Creators:
Marx, Vera Maria1, Author              
Cordill, Megan Jo2, Author              
Kirchlechner, Christoph3, Author              
Dehm, Gerhard4, Author              
Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
2Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22              
3Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2014-10
 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: Summer School: Theory and Practice of Modern Powder Diffraction, Tagungshaus Schönenberg, Ellwangen
Place of Event: Ellwangen, Germany
Start-/End Date: 2014-10-05 - 2014-10-08

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