In-situ stress measurements in thin films using synchrotron diffraction

Marx, Vera Maria; Cordill, Megan Jo; Kirchlechner, Christoph; Dehm, Gerhard

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In-situ stress measurements in thin films using synchrotron diffraction

Marx, V. M., Cordill, M. J., Kirchlechner, C., & Dehm, G. (2014). In-situ stress measurements in thin films using synchrotron diffraction. Talk presented at Summer School: Theory and Practice of Modern Powder Diffraction, Tagungshaus Schönenberg, Ellwangen. Ellwangen, Germany. 2014-10-05 - 2014-10-08.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-A2A2-F Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-AE1E-3

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Urheber:
Marx, Vera Maria¹, Autor
Cordill, Megan Jo², Autor
Kirchlechner, Christoph³, Autor
Dehm, Gerhard⁴, Autor

Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
2Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22
3Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398