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  Cs+ ion source for secondary ion mass spectrometry

Bentz, B. L., Weiß, H., & Liebl, H.(1981). Cs+ ion source for secondary ion mass spectrometry (IPP 9/37). Garching: Max-Planck-Institut für Plasmaphysik.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-6A55-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-6A56-9
Genre: Report

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IPP-9-37.pdf (Any fulltext), 12MB
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 Creators:
Bentz, B. L.1, Author
Weiß, H.1, Author
Liebl, H.2, Author           
Affiliations:
1Max Planck Society, ou_persistent13              
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              

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Language(s): eng - English
 Dates: 1981
 Publication Status: Issued
 Pages: -
 Publishing info: Garching : Max-Planck-Institut für Plasmaphysik
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 668626
Report Nr.: IPP 9/37
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