English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  Eine Methode zur Eichung der Messapparatur bei Streulichtmessungen an heissen Plasmen

Stoye, P.(1968). Eine Methode zur Eichung der Messapparatur bei Streulichtmessungen an heissen Plasmen (IPP 1/84). Garching(DE): Max-Planck-Institut für Plasmaphysik.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-722E-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-722F-8
Genre: Report

Files

show Files
hide Files
:
IPP 1_84.pdf (Any fulltext), 60MB
View   Save
File Permalink:
https://hdl.handle.net/11858/00-001M-0000-0027-7230-2
Name:
IPP 1_84.pdf
Description:
-
OA-Status:
Visibility:
Public
MIME-Type / Checksum:
application/pdf / [MD5]
Technical Metadata:
View
Copyright Date:
-
Copyright Info:
eDoc_access: PUBLIC
License:
-

Locators

show

Creators

show
hide
 Creators:
Stoye, P.1, Author           
Affiliations:
1External Organizations, ou_persistent22              

Content

show

Details

show
hide
Language(s): deu - German
 Dates: 1968
 Publication Status: Issued
 Pages: 38 pp.
 Publishing info: Garching(DE) : Max-Planck-Institut für Plasmaphysik
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 479890
Report Nr.: IPP 1/84
 Degree: -

Event

show

Legal Case

show

Project information

show

Source

show