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  EUV Spectroscopy of Highly Charged Xenon Ions

Biedermann, C., Radtke, R., Fussmann, G., Schwob, J. L., & Mandelbaum, P. (2005). EUV Spectroscopy of Highly Charged Xenon Ions. Nuclear Instruments Amd Methods in Physics Research. Section B, 235, 126-130. Retrieved from http://dx.doi.org/10.1016/j.nimb.2005.03.158.

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 Creators:
Biedermann, C.1, Author           
Radtke, R.1, Author           
Fussmann, G.1, Author           
Schwob, J. L.2, Author
Mandelbaum, P.2, Author
Affiliations:
1Plasma Diagnostics Group (HUB), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856324              
2Institut für Physik, Humboldt-Universität zu Berlin; Racah Institute of Physics, Hebrew University of Jerusalem, ou_persistent22              

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Free keywords: 12th International Conference on the Physics of Highly Charged Ions (HCI-2004), Vilnius, 2004-09-06 to 2004-09-10
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Language(s): eng - English
 Dates: 2005
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 313039
URI: http://dx.doi.org/10.1016/j.nimb.2005.03.158
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Title: Nuclear Instruments Amd Methods in Physics Research. Section B
Source Genre: Journal
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Publ. Info: Elsevier Ltd.
Pages: - Volume / Issue: 235 Sequence Number: - Start / End Page: 126 - 130 Identifier: -