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9th International Symposium on Electron Beam Ion Sources and Traps and Their Applications (EBIS/T 2004), Tokyo, 2004-04-15 to 2004-04-17
Abstract:
The dynamics of mixed ensembles of highly charged argon/xenon and krypton/xenon ions in an electron-beam ion trap (EBIT) was studied by recording the characteristic x-ray emission of the trapped ions. Sawtooth-like signatures manifest in the x-ray spectra for a variety of trap parameters. The effect can be understood as arising from the feedback between low-Z and high-Z ions.