Concepts of x-ray diagnostics for WENDELSTEIN 7-X

Weller, A.; Mohr, S.; Junghans, C.

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Concepts of x-ray diagnostics for WENDELSTEIN 7-X

Weller, A., Mohr, S., & Junghans, C. (2004). Concepts of x-ray diagnostics for WENDELSTEIN 7-X. Review of Scientific Instruments, 75, 3962-3965. Retrieved from http://dx.doi.org/10.1063/1.1789253.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-1F4E-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-1F4F-1

Genre: Journal Article

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Creators:
Weller, A.¹, Author
Mohr, S.¹, Author
Junghans, C.², Author

Affiliations:
1W7-X: Physics (PH), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856305
2University of Rostock, Germany, ou_persistent22

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Free keywords: 15th Topical Conference on High-Temperature Plasma Diagnostics, San Diego,CA, 2004-04-19 to 2004-04-22

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Language(s): eng - English

Dates: Date issued: 2004

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 205890
URI: http://dx.doi.org/10.1063/1.1789253

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 75 Sequence Number: - Start / End Page: 3962 - 3965 Identifier: ISSN: 0034-6748